• DocumentCode
    1212600
  • Title

    Properties of NRD-guide and H-guide higher-order modes: physical and nonphysical ranges

  • Author

    Nallo, Carlo Di ; Frezza, Fabrizio ; Galli, Alessandro ; Lampariello, Paolo ; Oliner, Arthur A.

  • Author_Institution
    Dipartimento di Ingegneria Elettronica, Rome Univ., Italy
  • Volume
    42
  • Issue
    12
  • fYear
    1994
  • fDate
    12/1/1994 12:00:00 AM
  • Firstpage
    2429
  • Lastpage
    2434
  • Abstract
    New, interesting modal properties are presented for the waveguiding structure consisting of a rectangular-section dielectric rod sandwiched between parallel conducting plates, which can represent either a nonradiative dielectric (NRD) guide or an H guide. A rigorous quantitative analysis of the dispersion properties, making use of both wavenumber and steepest-descent plots, indicates that higher-order modes can show different anomalous behaviors, as geometrical and electromagnetic parameters vary. A discussion of the physical nature of the waves related to complex wavenumbers allows us to illuminate the performance differences between NRD and H-guides, as regards certain previously unexplored leakage effects
  • Keywords
    dielectric waveguides; dispersion (wave); electromagnetic wave propagation; nonradiative dielectric waveguides; rectangular waveguides; waveguide theory; H-guide; NRD-guide; complex wavenumbers; dispersion properties; electromagnetic parameters; geometrical parameters; higher-order modes; leakage effects; modal properties; nonradiative dielectric guide; parallel conducting plates; quantitative analysis; rectangular-section dielectric rod; steepest-descent plots; waveguiding structure; wavenumber plots; Dielectrics; Eigenvalues and eigenfunctions; Electromagnetic analysis; Electromagnetic radiation; Electromagnetic scattering; Electromagnetic waveguides; Frequency; Millimeter wave circuits; Millimeter wave technology; Radiation effects;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.339777
  • Filename
    339777