• DocumentCode
    1212937
  • Title

    Thin silicon ion-implanted p-i-n photodiodes

  • Author

    Plumb, R.G. ; Carroll, J.E.

  • Author_Institution
    University of Cambridge, Engineering Department, Cambridge, UK
  • Volume
    1
  • Issue
    3
  • fYear
    1977
  • fDate
    4/1/1977 12:00:00 AM
  • Firstpage
    89
  • Lastpage
    91
  • Abstract
    Thin (6¿¿m) thick Si has been ion implanted to fabricate a p¿¿i¿¿n photodiode with an overall rise time probably better than 80 ps. The narrow depletion region gives short transit times, and the shallow ion-implanted junctions lead to minimal amounts of minority carrier storage, thus eliminating any slow tail to the voltage-output response to a step change of light input.
  • Keywords
    photodetectors; photodiodes; Si photodiodes; ion implanted junctions; minority carrier storage; narrow depletion region; overall rise time; short transit times;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Journal on
  • Publisher
    iet
  • ISSN
    0308-6968
  • Type

    jour

  • DOI
    10.1049/ij-ssed.1977.0010
  • Filename
    4807522