DocumentCode
1213268
Title
Optical Investigation of Surface Flashover Plasma Across Silicon Stimulated by Pulsed High Voltage in Vacuum Based on ICCD
Author
Zhao, Wen-Bin ; Zhang, Guan-Jun ; Dong, Ming ; Yan, Zhang
Author_Institution
Sch. of Electr. Eng., Xi´´an Jiaotong Univ., Xi´´an
Volume
36
Issue
4
fYear
2008
Firstpage
880
Lastpage
881
Abstract
Optical investigation of flashover phenomena across silicon is performed in vacuum. A pulse waveform of ~0.4/2.5 mus is employed as stimulation source. The p100-type silicon wafers are the samples. The images of flashover growing are recorded by intensified charge couple device, and the corresponding waveforms of voltage and current are given. The results primarily suggest that the flashover across p-type silicon begins with the distortion of electric field at the edge of anode. Injection of minors may play an important role in the formation process of filament current. It is regarded that the plasma produced by ionized desorbed gas will appear at the final stage of surface flashover.
Keywords
elemental semiconductors; flashover; plasma diagnostics; silicon; surface discharges; ICCD; Si; current waveform; electric field distortion; filament current; intensified charge couple device; ionized desorbed gas; optical investigation; p100-type silicon wafers; pulsed high-voltage stimulation; surface flashover plasma; voltage waveform; HV pulse; semiconductor; surface flashover;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2008.922483
Filename
4512500
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