• DocumentCode
    1213268
  • Title

    Optical Investigation of Surface Flashover Plasma Across Silicon Stimulated by Pulsed High Voltage in Vacuum Based on ICCD

  • Author

    Zhao, Wen-Bin ; Zhang, Guan-Jun ; Dong, Ming ; Yan, Zhang

  • Author_Institution
    Sch. of Electr. Eng., Xi´´an Jiaotong Univ., Xi´´an
  • Volume
    36
  • Issue
    4
  • fYear
    2008
  • Firstpage
    880
  • Lastpage
    881
  • Abstract
    Optical investigation of flashover phenomena across silicon is performed in vacuum. A pulse waveform of ~0.4/2.5 mus is employed as stimulation source. The p100-type silicon wafers are the samples. The images of flashover growing are recorded by intensified charge couple device, and the corresponding waveforms of voltage and current are given. The results primarily suggest that the flashover across p-type silicon begins with the distortion of electric field at the edge of anode. Injection of minors may play an important role in the formation process of filament current. It is regarded that the plasma produced by ionized desorbed gas will appear at the final stage of surface flashover.
  • Keywords
    elemental semiconductors; flashover; plasma diagnostics; silicon; surface discharges; ICCD; Si; current waveform; electric field distortion; filament current; intensified charge couple device; ionized desorbed gas; optical investigation; p100-type silicon wafers; pulsed high-voltage stimulation; surface flashover plasma; voltage waveform; HV pulse; semiconductor; surface flashover;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2008.922483
  • Filename
    4512500