DocumentCode
1213835
Title
Transfer of on states between closely spaced negative-resistance p+-i-n+diodes
Author
Supadech, S. ; Vachrapibool, P. ; Akiba, Y. ; Noda, K. ; Kurosu, Takayuki ; lida, M.
Author_Institution
King Mongkut´s Institute of Technology, Faculty of Engineering, Bangkok, Thailand
Volume
3
Issue
1
fYear
1979
fDate
1/1/1979 12:00:00 AM
Firstpage
21
Lastpage
24
Abstract
The possibility of making a shift register using an array of p+-i-n+diodes has been examined by investigating the transfer action of the on state of negative resistance characteristics between closely spaced p+-i-n+diodes. A gold-doped Si substrate is used to fabricate the p+-i-n+ structure. The possibility of the transfer of the on state has been examined. The main requirements for transferring are as follows: (a) The array of diodes must be located within about 500 ¿¿m in lateral length, (b) The operation time of the transfer action must be within about 10 ¿¿s. To clarify the transfer mechanism, experiments concerning the effect of carrier diffusion, Joule heat and recombination radiation due to on state current from one diode to the adjacent diode have been carried out. From the experimental results, it has been found that the transfer mechanism is dominated by carrier diffusion from the filamentary current path of one diode to the next.
Keywords
bipolar integrated circuits; digital integrated circuits; semiconductor diodes; shift registers; Joule heat; Si:Au substrate; carrier diffusion; closely spaced negative resistance p-i-n diodes; diode spacing <500 micron; experimental results; on state transfer; p+-i-n+ diodes; recombination radiation; shift registers; transfer mechanism;
fLanguage
English
Journal_Title
Solid-State and Electron Devices, IEE Journal on
Publisher
iet
ISSN
0308-6968
Type
jour
DOI
10.1049/ij-ssed.1979.0005
Filename
4807618
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