• DocumentCode
    1215498
  • Title

    Thermal-impedance ageing characteristics of c.w. stripe lasers

  • Author

    Plumb, R.G. ; Goodwin, A.R. ; Baulcomb, R.S.

  • Author_Institution
    Standard Telecommunication Laboratories Ltd., Harlow, UK
  • Volume
    3
  • Issue
    6
  • fYear
    1979
  • fDate
    11/1/1979 12:00:00 AM
  • Firstpage
    206
  • Lastpage
    209
  • Abstract
    Laser threshold currents increase with temperature, and appreciable heat has to be dissipated from the device while it is lasing. Low thermal impedance is therefore essential for c.w. operation at high temperatures and will also extend c.w. operating life at any temperature. Life tests at elevated temperatures on our lasers showed that, in the initial stages of ageing, increases in thermal impedance were dominant. Recent improvements in chip processing have increased the stability of the chip lasing parameters to the point where thermal impedance ageing is significant even at room temperature.1 In this paper, we describe failure analyses of early lasers, discuss possible solutions to the thermal-impedance ageing problem, and finally report controlled life tests of several improved metallisations which eliminate the problem.
  • Keywords
    ageing; semiconductor junction lasers; CW stripe lasers; failure analyses; laser threshold currents; life tests; metallisations; thermal impedance ageing characteristics;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Journal on
  • Publisher
    iet
  • ISSN
    0308-6968
  • Type

    jour

  • DOI
    10.1049/ij-ssed.1979.0041
  • Filename
    4807794