DocumentCode
1215498
Title
Thermal-impedance ageing characteristics of c.w. stripe lasers
Author
Plumb, R.G. ; Goodwin, A.R. ; Baulcomb, R.S.
Author_Institution
Standard Telecommunication Laboratories Ltd., Harlow, UK
Volume
3
Issue
6
fYear
1979
fDate
11/1/1979 12:00:00 AM
Firstpage
206
Lastpage
209
Abstract
Laser threshold currents increase with temperature, and appreciable heat has to be dissipated from the device while it is lasing. Low thermal impedance is therefore essential for c.w. operation at high temperatures and will also extend c.w. operating life at any temperature. Life tests at elevated temperatures on our lasers showed that, in the initial stages of ageing, increases in thermal impedance were dominant. Recent improvements in chip processing have increased the stability of the chip lasing parameters to the point where thermal impedance ageing is significant even at room temperature.1 In this paper, we describe failure analyses of early lasers, discuss possible solutions to the thermal-impedance ageing problem, and finally report controlled life tests of several improved metallisations which eliminate the problem.
Keywords
ageing; semiconductor junction lasers; CW stripe lasers; failure analyses; laser threshold currents; life tests; metallisations; thermal impedance ageing characteristics;
fLanguage
English
Journal_Title
Solid-State and Electron Devices, IEE Journal on
Publisher
iet
ISSN
0308-6968
Type
jour
DOI
10.1049/ij-ssed.1979.0041
Filename
4807794
Link To Document