• DocumentCode
    1215532
  • Title

    Reliability of Microwave Radio Reley Systems

  • Author

    Abraham, L.G.

  • Author_Institution
    Bell Telephone Labs., Holmdel, N. J.
  • Volume
    14
  • Issue
    6
  • fYear
    1966
  • fDate
    12/1/1966 12:00:00 AM
  • Firstpage
    805
  • Lastpage
    823
  • Abstract
    A model is proposed for microwave fading so that the outages of microwave relay systems due to propagation fading can be computed from fading data on individual channels. This is important so that the various system design factors can be evaluated as to reliability without extensive building and testing. Such design factors include fading margins, the number of working and protection channels, the width and allocation of radio channels, the number of radio hops per switching section, and the equipment failure rates. Quantitative data show that this theory checks outage data, at least in a particular case.
  • Keywords
    Buildings; Eigenvalues and eigenfunctions; Equipment failure; Fading; Microwave devices; Microwave propagation; Protective relaying; Relays; Signal to noise ratio; System testing;
  • fLanguage
    English
  • Journal_Title
    Communication Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9332
  • Type

    jour

  • DOI
    10.1109/TCOM.1966.1089399
  • Filename
    1089399