DocumentCode
1215532
Title
Reliability of Microwave Radio Reley Systems
Author
Abraham, L.G.
Author_Institution
Bell Telephone Labs., Holmdel, N. J.
Volume
14
Issue
6
fYear
1966
fDate
12/1/1966 12:00:00 AM
Firstpage
805
Lastpage
823
Abstract
A model is proposed for microwave fading so that the outages of microwave relay systems due to propagation fading can be computed from fading data on individual channels. This is important so that the various system design factors can be evaluated as to reliability without extensive building and testing. Such design factors include fading margins, the number of working and protection channels, the width and allocation of radio channels, the number of radio hops per switching section, and the equipment failure rates. Quantitative data show that this theory checks outage data, at least in a particular case.
Keywords
Buildings; Eigenvalues and eigenfunctions; Equipment failure; Fading; Microwave devices; Microwave propagation; Protective relaying; Relays; Signal to noise ratio; System testing;
fLanguage
English
Journal_Title
Communication Technology, IEEE Transactions on
Publisher
ieee
ISSN
0018-9332
Type
jour
DOI
10.1109/TCOM.1966.1089399
Filename
1089399
Link To Document