Parameter-free, predictive modeling of single event upsets due to protons, neutrons, and pions in terrestrial cosmic rays

In this paper we present a new approach and a computer software for modeling single event upsets. This model, named Soft Error Monte Carlo Model (SEMM), does not need any experimental inputs or any parameter fitting. It is intended to be a design tool for chip designers when they want to optimize their designs for soft error hardness and performance. The paper focuses on terrestrial cosmic rays that cause single event upsets. Details of the nuclear modeling and of the coupled device-circuit modeling are presented. Also presented are the comparison of SEMM predictions against measurements of single event upset rate in proton beam experiments and in computer main frame field tests performed at high ground elevations. We also present some proton-pion comparisons that are relevant to single event upsets.<>