• DocumentCode
    1216580
  • Title

    Radiation effects research in the 60´s

  • Author

    Conrad, Edward E.

  • Author_Institution
    7500 Marbury Rd., Bethesda, MD, USA
  • Volume
    41
  • Issue
    6
  • fYear
    1994
  • Firstpage
    2648
  • Lastpage
    2659
  • Abstract
    This talk provides a review of some of the significant issues and advances in nuclear radiation effects that took place in the 1960´s. The subjects include neutron induced displacement damage in semiconductors and ionization effects in semiconductor and dielectric materials and piece-parts. The relationship between the basic mechanisms and the radiation response of components in the areas of TREE, SGEMP, and thermomechanical effects will be described to show how the necessity for understanding and modeling was driven by the requirements for radiation hardened electronic systems. The accomplishments will be described within the context of a changing atmosphere of; international politics; the demise of atmospheric testing and the birth and evolution of the underground nuclear effects test; the evolution of above ground laboratory test facilities and; the eccentricities and passions of some of the people in the business.<>
  • Keywords
    dielectric materials; electromagnetic pulse; neutron effects; radiation effects; semiconductor device testing; semiconductor materials; 1960´s; SGEMP; TREE; atmospheric testing; business; dielectric materials; ground laboratory test facilities; international politics; ionization effects; neutron induced displacement damage; nuclear radiation effects; radiation effects research; radiation hardened electronic systems; radiation response; review; semiconductors; thermomechanical effects; underground nuclear effects test; Atmosphere; Atmospheric modeling; Dielectric materials; Ionization; Laboratories; Neutrons; Radiation effects; Radiation hardening; Testing; Thermomechanical processes;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.340627
  • Filename
    340627