DocumentCode
1217589
Title
A testability measure to improve algebraic test generation
Author
Lioy, Antonio ; Mezzalama, Marco
Author_Institution
Politecnico di Torino, Dipartimento di Automatica e Informatica, CAD Group, Torino, Italy
Volume
3
Issue
2
fYear
1984
fDate
4/1/1984 12:00:00 AM
Firstpage
37
Lastpage
41
Abstract
The paper deals with testability measures of digital systems. Specifically, a new algorithm to evaluate testability measures for circuits described in terms of Boolean equations is presented, and its application to speed up (algebraic) test generation for sequential networks is discussed.
Keywords
fault location; field effect integrated circuits; integrated circuit testing; large scale integration; Boolean equations; algebraic test generation; digital systems; sequential networks; testability measures;
fLanguage
English
Journal_Title
Software & Microsystems
Publisher
iet
ISSN
0261-3182
Type
jour
DOI
10.1049/sm.1984.0013
Filename
4808126
Link To Document