• DocumentCode
    1219340
  • Title

    Error correction of transformed rectangular model of concave and convex MAGFETs with AC bias

  • Author

    Sung, G.-M. ; Liu, S.-I.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taipei Univ. of Technol., Taiwan
  • Volume
    151
  • Issue
    6
  • fYear
    2004
  • Firstpage
    593
  • Lastpage
    600
  • Abstract
    The authors derive and experimentally confirm the error correction factor, which is used to compensate for the induced current difference, according to the geometric parameters of concave and convex MAGFETs. The measurement results indicate that the highest absolute sensitivity SA, the supply-current-related sensitivity SRI and the supply-voltage-related sensitivity SRV, are 88.82 mV/T, 2121.74 V/A.T and 177.65 mV/V.T, respectively, for concave MAGFETs and SA=261.34 mV/T, SRI=6008.26 V/A.T and SRV=522.68 mV/V.T for convex MAGFETs with 0.5 V AC bias voltage, which is applied with high-frequency, 100 kHz, to decrease the 1/f noise. The sensitivities of convex MAGFETs are greater than those of concave MAGFETs, and the transformed model needs to be built with a low aspect ratio (L/W) and a high drain gap (d). Given a consistent geometric correction factor, the convex MAGFET with geometric parameters, L/W=40 μm/80 μm and d=2 μm, is the best choice, and the concave MAGFET with L/W=40 μm/40 μm and d=4 μm, is another good choice. Both a broadened drain gap and a small aspect ratio reduce the measured geometric correction factor (G) by increasing the magnitude of the error correction factor.
  • Keywords
    error correction; field effect transistors; magnetic devices; 1/f noise; AC bias; concave MAGFET; convex MAGFET; error correction factor; geometric correction factor; high drain gap; induced current difference compensation; low aspect ratio; magnetic field effect transistors; supply-current-related sensitivity; supply-voltage-related sensitivity; transformed rectangular model;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2409
  • Type

    jour

  • DOI
    10.1049/ip-cds:20040255
  • Filename
    1387808