• DocumentCode
    1219545
  • Title

    A Kinetic Model for the Reactions of Co and H2 to CH4 and C2H2 in a Flow Microwave Discharge Reactor

  • Author

    Mertz, S.F. ; Hawley, M.C. ; Asmussen, J.

  • Author_Institution
    Departments of Chemical Engineering and Electrical Engineering Michigan State University East Lansing, Michigan 48824
  • Volume
    4
  • Issue
    1
  • fYear
    1976
  • fDate
    3/1/1976 12:00:00 AM
  • Firstpage
    11
  • Lastpage
    23
  • Abstract
    A kinetic model was developed to describe the reactions of CO and H2 to CH4 and C2H2in a microwave plasma. The experimental system consisted of a 24 mm I.D. tubular quartz reactor which passed through a microwave cavity. A variable-incident power waveguide system could supply up to 800 watts of incident microwave power to the cavity. The reactant gas mixture of H2 and CO flowed through the reactor, where a plasma was maintained under pressures of 20 - 100 mm Hg. The reactor effluent was analyzed by IR spectroscopy for CH4 and C2H2. Conversions of up to 5.3% CO to C2H2 and 7.2% CO to CH4 were observed. A 26-reaction kinetic model was developed and fitted to the experimental data. The plasma reactor was modeled in two zones: a discharge zone where electron-impact dissociations produce H, C, and O, and a downstream recombination zone where the atomic species from the discharge recombine. The discharge zone was modeled as a well-mixed reactor, and the recombination zone was modeled as a plug-flow reactor. The model was able to explain the asymptotic shape of the observed conversion versus residence time data; the effect is due to a kinetic limitation. This also explains why the conversions obtained in the plasma cannot be predicted by thermodynamic equilibrium.
  • Keywords
    Effluents; Hydrogen; Inductors; Infrared spectra; Kinetic theory; Mercury (metals); Plasma waves; Power system modeling; Spectroscopy; Spontaneous emission;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.1976.4316925
  • Filename
    4316925