• DocumentCode
    1219678
  • Title

    Multistate degradable system modelling and analysis

  • Author

    Hsieh, Jen-Wei ; Ucci, D.R. ; Kraft, G.D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • Volume
    25
  • Issue
    23
  • fYear
    1989
  • Firstpage
    1557
  • Lastpage
    1558
  • Abstract
    A failing digital system may be represented by a multistate Markov diagram in which the system functions in a degraded mode of execution before total failure occurs. The models proposed to date do not consider more than one intermittent fault state, which limits the flexibility of modelling, nor do they take repair into consideration. In the letter the authors present a very general continuous-parameter Markov model at the processor level. They also show that this model can be generalised to evaluate the reliability and performability of multi-processor systems. A closed-form solution is also given for the above modelling.
  • Keywords
    Markov processes; multiprocessing systems; performance evaluation; closed-form solution; continuous-parameter Markov model; degraded mode; failing digital system; multi-processor systems; multistate Markov diagram; performability; reliability; total failure;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19891046
  • Filename
    138790