DocumentCode
1219678
Title
Multistate degradable system modelling and analysis
Author
Hsieh, Jen-Wei ; Ucci, D.R. ; Kraft, G.D.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
Volume
25
Issue
23
fYear
1989
Firstpage
1557
Lastpage
1558
Abstract
A failing digital system may be represented by a multistate Markov diagram in which the system functions in a degraded mode of execution before total failure occurs. The models proposed to date do not consider more than one intermittent fault state, which limits the flexibility of modelling, nor do they take repair into consideration. In the letter the authors present a very general continuous-parameter Markov model at the processor level. They also show that this model can be generalised to evaluate the reliability and performability of multi-processor systems. A closed-form solution is also given for the above modelling.
Keywords
Markov processes; multiprocessing systems; performance evaluation; closed-form solution; continuous-parameter Markov model; degraded mode; failing digital system; multi-processor systems; multistate Markov diagram; performability; reliability; total failure;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19891046
Filename
138790
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