• DocumentCode
    121973
  • Title

    Device for comprehensive analysis of leakage current paths in photovoltaic module packaging materials

  • Author

    Dhere, Neelkanth G. ; Shiradkar, Narendra S. ; Schneller, Eric

  • Author_Institution
    Florida Solar Energy Center, Univ. of Central Florida, Cocoa, FL, USA
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    2007
  • Lastpage
    2010
  • Abstract
    Photovoltaic (PV) modules in high voltage systems are prone to power loss over time due to leakage current flowing through the module packaging materials. A device has been developed to measure impedances of individual paths of leakage current. This has made it possible to understand the contributions of materials and interfaces responsible for degradation. This was not possible earlier when only total leakage currents were being measured. Detailed analysis of the leakage current paths in the PV modules under high voltage bias is carried out over an extended period. Knowledge about dominant leakage current paths can be used to quantify the physical and chemical changes occurring within the module packaging materials.
  • Keywords
    electric current measurement; electric impedance measurement; leakage currents; modules; packaging; photovoltaic power systems; PV module; high voltage system; impedance measurement; leakage current measurement; leakage current path analysis; photovoltaic module; photovoltaic module packaging material; power loss; Current measurement; Laminates; Leakage currents; Packaging; Photovoltaic systems; PV Module; Potential Induced Degradation; Reliability; System Voltage Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6925320
  • Filename
    6925320