• DocumentCode
    121974
  • Title

    One-dimensional reaction-diffusion simulation of Cu migration in polycrystalline CdTe solar cells

  • Author

    Guo, Di ; Akis, R. ; Brinkman, D. ; Sankin, I. ; Fang, Tao ; Vasileska, D. ; Ringhofer, C.

  • Author_Institution
    Sch. of Electr., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    2011
  • Lastpage
    2015
  • Abstract
    In this work, we report on developing 1D reaction-diffusion solver to understand the kinetics of p-type doping formation in CdTe absorbers and to shine some light on underlying causes of metastabilities observed in CdTe PV devices. Evolution of intrinsic and Cu-related defects in CdTe solar cell has been studied in time-space domain self-consistently with free carrier transport and Poisson equation. Resulting device performance was simulated as a function of Cu diffusion anneal time showing pronounced effect the evolution of associated acceptor and donor states can cause on device characteristics. Although 1D simulation has intrinsic limitations when applied to poly-crystalline films, the results suggest strong potential of the approach in better understanding of the performance and metastabilities of CdTe photovoltaic device.
  • Keywords
    II-VI semiconductors; Poisson equation; cadmium compounds; copper; solar cells; tellurium compounds; 1D reaction-diffusion solver; 1D simulation; CdTe; Cu; Poisson equation; absorbers; acceptor states; device performance; diffusion anneal time; donor states; free carrier transport; metastabilities; one-dimensional reaction-diffusion simulation; p-type doping formation; photovoltaic device; poly-crystalline films; polycrystalline solar cells; time-space domain; Copper; Doping; Films; Mathematical model; Performance evaluation; Photovoltaic cells; Stress; cadmium compounds; copper; numerical simulation; photovoltaic cells; semiconductor device reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6925321
  • Filename
    6925321