• DocumentCode
    1221135
  • Title

    Parameter Estimation Employing a Dual-Channel Sine-Wave Model Under a Gaussian Assumption

  • Author

    Händel, Peter

  • Author_Institution
    ACCESS Linnaeus Center, R. Inst. of Technol., Stockholm
  • Volume
    57
  • Issue
    8
  • fYear
    2008
  • Firstpage
    1661
  • Lastpage
    1669
  • Abstract
    The Cramer-Rao bound (CRB) is a lower bound on the error variance of any estimator. For a Gaussian scenario, the CRB is derived for a seven-parameter, dual-channel sine-wave model, which is a model relevant to applications such as impedance measurements and the estimation of particle size and velocity by laser anemometry. Four different parameterizations were considered: the common quadrature/in-phase and amplitude-phase models and two relative amplitude-phase models. The CRB indicated the achievable error variance of an unbiased estimator as a function of the signal-to-noise ratio (SNR), the number of samples, and noise power. A nonlinear least squares fit of the signal model to the collected data was employed. The problem at hand is separable and can be solved by a 1-D search followed by a linear least squares fit of the remaining parameters. The performance of the method was investigated with the aid of a simulation study, and the outcome was compared with that of the corresponding CRB and with a recently proposed seven-parameter fit. For high SNRs, the performance of the proposed method is close to optimal with an error variance close to the predictions made by the CRB.
  • Keywords
    IEEE standards; error analysis; least squares approximations; parameter estimation; signal processing; Cramer-Rao bound; amplitude-phase model; dual-channel sine-wave model; error variance; laser anemometry; nonlinear least squares fit; parameter estimation; particle size estimation; quadrature/in-phase model; signal-to-noise ratio; CramÉr–Rao bound (CRB); Cram??r??Rao bound (CRB); IEEE Standards 1057 and 1241; line spectral analysis; nonlinear least squares (NLS); seven-parameter model; sine-wave fit;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2008.923782
  • Filename
    4523342