• DocumentCode
    1223458
  • Title

    Design and performance of tunnel collector HBTs for microwave power amplifiers

  • Author

    Welty, Rebecca J. ; Mochizuki, Kazuhiro ; Lutz, Charles R. ; Welser, Roger E. ; Asbeck, Peter M.

  • Author_Institution
    Lawrence Livermore Nat. Lab., CA, USA
  • Volume
    50
  • Issue
    4
  • fYear
    2003
  • fDate
    4/1/2003 12:00:00 AM
  • Firstpage
    894
  • Lastpage
    900
  • Abstract
    AlGaAs/GaAs/GaAs and GaInP/GaAs/GaAs n-p-n heterojunction bipolar transistors (HBTs) are now in widespread use in microwave power amplifiers. In this paper, improved HBT structures are presented to address issues currently problematic for these devices: high offset and knee voltages and saturation charge storage. Reduced HBT offset and knee voltages (VCE,os and Vk) are important to improve the power amplifier efficiency. Reduced saturation charge storage is desirable to increase gain under conditions when the transistor saturates (such as in over-driven Class AB amplifiers and switching mode amplifiers). It is shown in this paper that HBT structures using a 100-Å-thick layer of GaInP between the GaAs base, and collector layers are effective in reducing VCE,os to 30 mV and Vk measured at a collector current density of 2×104 A/cm2 to 0.3 V (while for conventional HBTs VCE,os=0.2 V and Vk=0.5 V are typical). A five-fold reduction in saturation charge storage is simultaneously obtained.
  • Keywords
    current density; heterojunction bipolar transistors; microwave bipolar transistors; tunnel transistors; 0.3 V; 100 Å; 30 mV; AlGaAs-GaAs-GaAs; AlGaAs/GaAs/GaAs; GaInP-GaAs-GaAs; GaInP/GaAs/GaAs; collector current density; heterojunction bipolar transistors; knee voltages; microwave power amplifiers; offset voltages; power amplifier efficiency; saturation charge storage; tunnel collector HBTs; Current measurement; Density measurement; Gain measurement; Gallium arsenide; Heterojunction bipolar transistors; Knee; Microwave amplifiers; Microwave devices; Power amplifiers; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2003.812088
  • Filename
    1206868