DocumentCode
1225495
Title
Process-Invariant Current Source Design: Methodology and Examples
Author
Pappu, Anand M. ; Zhang, Xuan ; Harrison, Andre V. ; Apsel, Alyssa B.
Author_Institution
Cornell Univ., Ithaca
Volume
42
Issue
10
fYear
2007
Firstpage
2293
Lastpage
2302
Abstract
In this paper, we present a design methodology and resulting circuits that compensate for process variations without the need for post-fabrication efforts. We demonstrate how, using this methodology, current sources have been designed with more than a factor of two reduction in normalized standard deviation over equivalent uncompensated current sources. To the best of our knowledge, these are the first measured results showing effective circuit design techniques that reduce the impact of process variations by such magnitude. Such circuits can be an effective way to improve circuit yield as process variations increase.
Keywords
constant current sources; integrated circuit design; integrated circuit yield; current source design; equivalent uncompensated current sources; integrated circuit design; integrated circuit yield; normalized standard deviation; post-fabrication efforts; process variations; CMOS technology; Circuit synthesis; Design methodology; Energy consumption; Feedback circuits; Frequency; Histograms; Process design; Robustness; Voltage-controlled oscillators; Analog design; circuit design techniques; constant current source; deep-submicron circuits; process variations;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2007.905240
Filename
4317709
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