• DocumentCode
    1225495
  • Title

    Process-Invariant Current Source Design: Methodology and Examples

  • Author

    Pappu, Anand M. ; Zhang, Xuan ; Harrison, Andre V. ; Apsel, Alyssa B.

  • Author_Institution
    Cornell Univ., Ithaca
  • Volume
    42
  • Issue
    10
  • fYear
    2007
  • Firstpage
    2293
  • Lastpage
    2302
  • Abstract
    In this paper, we present a design methodology and resulting circuits that compensate for process variations without the need for post-fabrication efforts. We demonstrate how, using this methodology, current sources have been designed with more than a factor of two reduction in normalized standard deviation over equivalent uncompensated current sources. To the best of our knowledge, these are the first measured results showing effective circuit design techniques that reduce the impact of process variations by such magnitude. Such circuits can be an effective way to improve circuit yield as process variations increase.
  • Keywords
    constant current sources; integrated circuit design; integrated circuit yield; current source design; equivalent uncompensated current sources; integrated circuit design; integrated circuit yield; normalized standard deviation; post-fabrication efforts; process variations; CMOS technology; Circuit synthesis; Design methodology; Energy consumption; Feedback circuits; Frequency; Histograms; Process design; Robustness; Voltage-controlled oscillators; Analog design; circuit design techniques; constant current source; deep-submicron circuits; process variations;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2007.905240
  • Filename
    4317709