Degradation Analysis of 2-μm DFB Laser Using Optical Beam-Induced Current Technique

Author

Takeshita, Tatsuya ; Sato, Tomonari ; Mitsuhara, Manabu ; Kondo, Yasuhiro ; Sugo, Mitsuru ; Kato, Kazutoshi

Author_Institution

NTT Co., Atsugi

Volume

54

Issue

10

fYear

2007

Firstpage

2644

Lastpage

2649

Abstract

The degradation behavior of 2-mum wavelength distributed feedback lasers with a p- and n-type InP buried heterostructure during constant-power aging is investigated. The degradation mechanism is governed by diffused defects with a parallel direction in the crystal plane. Furthermore, it is clarified that the epitaxial layers on the mesa affect both first- and second-stage degradations.

Keywords

OBIC; distributed feedback lasers; failure analysis; laser reliability; quantum well lasers; DFB laser; buried heterostructure; degradation analysis; failure analysis; laser reliability; optical beam induced current technique; photon beams; quantum well lasers; semiconductor lasers; wavelength distributed feedback lasers; Biomedical optical imaging; Degradation; Distributed feedback devices; Gas lasers; Indium phosphide; Laser feedback; Laser modes; Optical beams; Optical feedback; Waveguide lasers; Aging; failure analysis; indium compounds; laser reliability; photon beams; quantum well lasers; semiconductor lasers;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/TED.2007.904961

Filename

4317750