• DocumentCode
    1225940
  • Title

    Doping-type dependence of turn-on delay time in 1.3-μm InGaAsP-InP modulation-doped strained quantum-well lasers

  • Author

    Niwa, A. ; Ohtoshi, T. ; Uomi, K. ; Nakahara, K.

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • Volume
    8
  • Issue
    3
  • fYear
    1996
  • fDate
    3/1/1996 12:00:00 AM
  • Firstpage
    328
  • Lastpage
    330
  • Abstract
    The dependence of turn-on delay time on doping type in 1.3-μm InGaAsP-InP modulation-doped (MD) strained quantum-well (QW) lasers is theoretically investigated, based on the detailed band structure model including the band mixing effects. It is found that the turn-on delay time in n-type MD lasers is reduced to 1/4 that of undoped lasers due to both a lower threshold current and a reduced carrier lifetime. The reduction of the delay time is smaller in p-type MD lasers, however, because of the increased threshold current. These results show that the n-type MD-QW lasers are superior for high-speed modulation under zero-bias conditions.
  • Keywords
    III-V semiconductors; band structure; carrier lifetime; delays; gallium arsenide; gallium compounds; indium compounds; laser theory; optical modulation; quantum well lasers; semiconductor device models; semiconductor doping; 1.3 mum; InGaAsP-InP; InGaAsP-InP modulation-doped strained quantum-well lasers; band mixing effects; band structure model; doping-type dependence; high-speed modulation; lower threshold current; n-type MD lasers; n-type MD-QW lasers; reduced carrier lifetime; threshold current; turn-on delay time; zero-bias conditions; Charge carrier lifetime; Delay effects; Doping; Epitaxial layers; Laser modes; Laser theory; Quantum well lasers; Semiconductor process modeling; Spontaneous emission; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.481106
  • Filename
    481106