• DocumentCode
    1226110
  • Title

    Monte Carlo simulation of gamma ray spectra from semiconductor detectors

  • Author

    Olschner, F. ; Lund, J.C. ; Stern, I.

  • Author_Institution
    Radiat. Monitoring Devices Inc., Watertown, MA, USA
  • Volume
    36
  • Issue
    1
  • fYear
    1989
  • fDate
    2/1/1989 12:00:00 AM
  • Firstpage
    1176
  • Lastpage
    1179
  • Abstract
    Monte Carlo techniques have been used to simulate gamma-ray pulse-height spectra from rectangularly shaped CdTe detectors in the energy range of a few keV to approximately 1 MeV. The simulation results were found to agree well with measured CdTe gamma-ray pulse-height spectra. The various physical events occurring within the detector are simulated in a naturally sequential manner. Specifically, the algorithm simulates such effects as exponentially absorbed radiation, multiple Compton scattering within the detector, charge-carrier trapping, and electronic noise (Gaussian). Advantages of this simulation method are the compactness of the code (allowing the use of microcomputers) and speed of operation (approximately 15 events per second)
  • Keywords
    Monte Carlo methods; gamma-ray spectra; semiconductor counters; CdTe detectors; Monte Carlo simulation; charge-carrier trapping; electronic noise; exponentially absorbed radiation; gamma ray spectra; gamma-ray pulse-height spectra; multiple Compton scattering; semiconductor detectors; Discrete event simulation; Electron traps; Event detection; Gamma ray detection; Gamma ray detectors; Monte Carlo methods; Pulse measurements; Pulse shaping methods; Radiation detectors; Scattering;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.34627
  • Filename
    34627