• DocumentCode
    1229828
  • Title

    Comments on "A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters" [with reply]

  • Author

    Pospieszalski, M.W. ; Martines, G. ; Sannino, M.

  • Author_Institution
    Nat. Radio Astron. Obs., Charlottesville, VA, USA
  • Volume
    36
  • Issue
    1
  • fYear
    1988
  • Firstpage
    170
  • Lastpage
    172
  • Abstract
    For the original article see ibid., vol.MTT-35, no.1, p.71-5 (1987). The commenter points out that equations (1), (2), and (3) of the above named work are true only if the tuner´s physical temperature is 290 K. It is noted that the derivation of other equations is needlessly complicated. In replying, the authors show that any error arising from this assumption is negligible. In rebutting the reply, the commenter notes that in some cases, the errors introduced by the assumption are not negligible.<>
  • Keywords
    electric noise measurement; electron device noise; loss measurement; microwave devices; microwave measurement; semiconductor device testing; transistors; losses; measurement; noise-matching microwave network; semiconductor device testing; transistor noise parameters; Equivalent circuits; Extraterrestrial measurements; Intelligent networks; Isolators; Loss measurement; Microwave measurements; Microwave theory and techniques; Noise measurement; Temperature; Tuners;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.3503
  • Filename
    3503