DocumentCode
1229828
Title
Comments on "A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters" [with reply]
Author
Pospieszalski, M.W. ; Martines, G. ; Sannino, M.
Author_Institution
Nat. Radio Astron. Obs., Charlottesville, VA, USA
Volume
36
Issue
1
fYear
1988
Firstpage
170
Lastpage
172
Abstract
For the original article see ibid., vol.MTT-35, no.1, p.71-5 (1987). The commenter points out that equations (1), (2), and (3) of the above named work are true only if the tuner´s physical temperature is 290 K. It is noted that the derivation of other equations is needlessly complicated. In replying, the authors show that any error arising from this assumption is negligible. In rebutting the reply, the commenter notes that in some cases, the errors introduced by the assumption are not negligible.<>
Keywords
electric noise measurement; electron device noise; loss measurement; microwave devices; microwave measurement; semiconductor device testing; transistors; losses; measurement; noise-matching microwave network; semiconductor device testing; transistor noise parameters; Equivalent circuits; Extraterrestrial measurements; Intelligent networks; Isolators; Loss measurement; Microwave measurements; Microwave theory and techniques; Noise measurement; Temperature; Tuners;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.3503
Filename
3503
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