DocumentCode
123059
Title
Efficient region-aware P/G TSV planning for 3D ICs
Author
Song Yao ; Xiaoming Chen ; Yu Wang ; Yuchun Ma ; Yuan Xie ; Huazhong Yang
Author_Institution
Tsinghua Nat. Lab. for Inf. Sci. & Technol., Tsinghua Univ., Beijing, China
fYear
2014
fDate
3-5 March 2014
Firstpage
171
Lastpage
178
Abstract
Power delivery network (PDN) design is one of the most critical challenges in 3D Integrated Circuits (IC) design. In existing studies, to ensure the robustness of the 3D PDN, the number of TSVs was always increased inefficiently to mitigate the IR-drop and power noise. However, the overhead for connections is a crucial obstacle to the development of 3D ICs. Consequently, an efficient TSV topology is needed to reduce the overhead of TSVs while meeting the power supply requirements. The redundant TSVs may introduce more keep-out zones, decrease the core utilization of the chip, and lead to high cost. In this paper, we propose a region-aware TSV planning algorithm which can distribute TSV resources non-evenly over different areas according to their IR-drop constraints separately. This method can use fewer power TSVs to meet the power integrity constraint of the whole chip while guaranteeing the functionality. Furthermore, to ensure the practicability, we also take the whitespace into account. Experimental results show that, the proposed algorithm can save on average 42% and 27% power TSV resources without and with whitespace consideration respectively compared with the evenly TSV planning algorithm.
Keywords
integrated circuit design; network topology; three-dimensional integrated circuits; 3D IC design; 3D IC development; 3D integrated circuit design; IR-drop mitigation; PDN design; TSV resource distrubution; TSV topology; chip core utilization; efficient region-aware P-G TSV planning; overhead reduction; power delivery network design; power integrity constraint; power noise; power supply requirement; region-aware TSV planning algorithm; whitespace consideration; Algorithm design and analysis; Benchmark testing; Planning; Three-dimensional displays; Through-silicon vias; Topology; Wires; 3D power delivery network; distributed IR-drop constraint; non-evenly TSV topology; region-aware TSV planning; whitespace consideration;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2014 15th International Symposium on
Conference_Location
Santa Clara, CA
Print_ISBN
978-1-4799-3945-9
Type
conf
DOI
10.1109/ISQED.2014.6783321
Filename
6783321
Link To Document