• DocumentCode
    123078
  • Title

    Computer simulation of radiation-induced clock-perturbation in phase-locked loop with analog behavioral model

  • Author

    Fujita, Takashi ; SinNyoung Kim ; Onodera, Hidetoshi

  • Author_Institution
    Ritsumeikan Univ., Kusatsu, Japan
  • fYear
    2014
  • fDate
    3-5 March 2014
  • Firstpage
    230
  • Lastpage
    235
  • Abstract
    A PLL behavioral model for a single event caused by a radiation strike is proposed in this paper. This model describes the behaviors of the radiation-induced transients in the circuit blocks of the PLL. The simulation results when comparing our proposed model with a SPICE simulation showed that our proposed model is identical to that of SPICE, but our proposed model is about 2,500 times faster. Our behavioral model is used to investigate the minimization strategy of the recovery time from the single event. We found after conducting a large number of simulations that a system with a damping factor of around 1 is the optimal design for a given recovery time. We were able to reach this conclusion within a short period of time thanks to the high-speed behavioral simulation.
  • Keywords
    phase locked loops; radiation hardening (electronics); PLL behavioral model; PLL circuit blocks; SPICE simulation; analog behavioral model; computer simulation; damping factor; high-speed behavioral simulation; optimal design; phase-locked loop; radiation strike; radiation-induced clock-perturbation; radiation-induced transients; recovery time minimization strategy; Hardware design languages; Integrated circuit modeling; Iterative closest point algorithm; Phase frequency detector; Phase locked loops; SPICE; Voltage-controlled oscillators; Phase-locked loop; clock perturbation; radiation induced transient; single event;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2014 15th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-3945-9
  • Type

    conf

  • DOI
    10.1109/ISQED.2014.6783330
  • Filename
    6783330