Multiscale corner detection by using wavelet transform

Author

Lee, Jiann-Shu ; Sun, Yung-Nien ; Chen, Chin-Hsing

Author_Institution

Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan

Volume

4

Issue

1

fYear

1995

fDate

1/1/1995 12:00:00 AM

Firstpage

100

Lastpage

104

Abstract

A multiscale corner detection algorithm based on the wavelet transform of contour orientation is proposed. It can utilize both the information of the local extrema and modulus of transform results to detect corners and arcs effectively. The ramp-width of contour orientation profile, which can be computed using the transformed modulus of two scales, reveals the difference between corner and arc and is utilized in the determination of corner points. The experimental results have shown that the detector is more effective than both the single- and multiple-scale detectors. They also demonstrate that the detector is insensitive to boundary noise. In addition, the proposed method is more efficient than the other multiscale corner detector because it operates on fewer number of scales, which can be implemented by a fast transform algorithm

Keywords

edge detection; wavelet transforms; arcs; boundary noise; contour orientation; fast transform algorithm; local extrema; modulus; multiscale corner detection; ramp-width; transform results; wavelet transform; Continuous wavelet transforms; Convolution; Detectors; Smoothing methods; Spline; Wavelet transforms;

fLanguage

English

Journal_Title

Image Processing, IEEE Transactions on

Publisher

ieee

ISSN

1057-7149

Type

jour

DOI

10.1109/83.350810

Filename

350810