• DocumentCode
    1231580
  • Title

    A Comprehensive Methodology for Complex Field Programmable Gate Array Single Event Effects Test and Evaluation

  • Author

    Berg, Melanie D. ; LaBel, Kenneth A. ; Kim, Hak ; Friendlich, Mark ; Phan, Anthony ; Perez, Christopher

  • Author_Institution
    NASA Goddard Space Flight Center, Greenbelt, MD
  • Volume
    56
  • Issue
    2
  • fYear
    2009
  • fDate
    4/1/2009 12:00:00 AM
  • Firstpage
    366
  • Lastpage
    374
  • Abstract
    A methodology for evaluating various types of FPGAs targeted for space missions is presented. The premise is to supply unambiguous SEE information so that flight-projects may insert the optimal device for their application.
  • Keywords
    aerospace instrumentation; field programmable gate arrays; field programmable gate array; single event effects; space missions; test; triple mode redundancy; Aerospace electronics; Aerospace industry; Availability; Field programmable gate arrays; Manufacturing; NASA; Single event upset; Space technology; Switches; Testing; Evaluation; FPGA; Triple Mode Redundancy (TMR); scrubbing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2013857
  • Filename
    4812297
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1231580