• DocumentCode
    1232739
  • Title

    Extended phase-mode logic-circuits with resistive ground contact

  • Author

    Onomi, T. ; Mizugaki, Y. ; Nakajima, K. ; Yamashita, T.

  • Author_Institution
    Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan
  • Volume
    5
  • Issue
    3
  • fYear
    1995
  • Firstpage
    3464
  • Lastpage
    3471
  • Abstract
    We present extended phase-mode logic (EPL) circuits which have resistive ground contact. The phase-mode logic utilizes magnetic flux-transfer and is based on pulse propagation, i.e., it is one of single flux quantum systems. The proposed logic circuits of the EPL family can have the same ground reference, contrary to the original phase-mode circuits, Therefore, it is possible to couple different EPL elements on a single ground reference. Basic components of the EPL family (a phase-conserving branch, a phase-distributing branch, and an INHIBIT gate controlled by fluxon) are presented. The phase-distributing branch and the INHIBIT gate have been fabricated using a Nb/AlO/sub x//Nb Josephson-junction technology and tested. A fan-in operation of the phase-distributing branch and the first full operation of the INHIBIT gate are successfully demonstrated. As an example of the EPL logic circuits consisting of plural gates on a single ground reference, a simulation of a 2-bit full adder circuit is also presented.<>
  • Keywords
    adders; aluminium compounds; logic gates; niobium; superconducting device testing; superconducting logic circuits; superconductor-insulator-superconductor devices; 2 bit; 2-bit full adder circuit simulation; Nb-AlO-Nb; Nb/AlO/sub x//Nb Josephson-junction technology; S-branch circuit; extended phase-mode logic-circuits; fan-in operation; fluxon controlled INHIBIT gate; ground reference; magnetic flux-transfer; phase-conserving branch; phase-distributing branch; pulse propagation; resistive ground contact; single flux quantum systems; Adders; Circuit simulation; Circuit testing; Coupling circuits; Josephson junctions; Logic circuits; Magnetic flux; Niobium; Page description languages; Voltage;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.413152
  • Filename
    413152