DocumentCode
1233541
Title
A sensitivity figure for yield improvement [manufacturable microwave circuit design]
Author
Purviance, John E. ; Meehan, Michael D.
Author_Institution
Dept. of Electr. Eng., Idaho Univ., Moscow, ID, USA
Volume
36
Issue
2
fYear
1988
fDate
2/1/1988 12:00:00 AM
Firstpage
413
Lastpage
417
Abstract
A network sensitivity figure for use in gradient-type optimizers which accounts for random parameter variations encountered during manufacturing is introduced. The difference between conventional sensitivity descriptions and the authors´ sensitivity figure is analyzed and explained. Two examples are presented where yield improvement is obtained using the new sensitivity figure in a gradient-type optimizer
Keywords
integrated circuit manufacture; microwave integrated circuits; multiport networks; network synthesis; optimisation; sensitivity analysis; gradient-type optimizers; interconnected two-port networks; microwave circuit design; network sensitivity; random parameter variations; yield improvement; Circuit optimization; Circuit synthesis; Design optimization; Fabrication; Gradient methods; Manufacturing; Manufacturing processes; Optimization methods; Process design; Production; Sensitivity analysis;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.3530
Filename
3530
Link To Document