• DocumentCode
    1234241
  • Title

    Multiple broad-band source location using steered covariance matrices

  • Author

    Krolik, Jeffrey ; Swingler, David

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada
  • Volume
    37
  • Issue
    10
  • fYear
    1989
  • fDate
    10/1/1989 12:00:00 AM
  • Firstpage
    1481
  • Lastpage
    1494
  • Abstract
    The authors present an approach for reducing the threshold observation time required to achieve high-resolution localization of multiple broadband sources. The proposed techniques are based on a space-time statistic called the steered covariance matrix (STCM). The STCM, like the well-known cross-spectral density matrix (CSDM), has asymptotic properties which facilitate high-resolution source localization. In broadband settings, however, the STCM has the advantage that it can be estimated with much greater statistical stability than the CSDM. The STCM is used in conjunction with minimum variance and linear predictive spectral estimation to obtain the steered minimum variance (STMV) and steered linear prediction (STLP) methods. Analytical and simulation results are presented that indicate that the STMV and STLP methods exhibit lower threshold observation times than their CSDM-based counterparts
  • Keywords
    matrix algebra; signal detection; spectral analysis; analytical results; asymptotic properties; cross-spectral density matrix; high-resolution localization; linear predictive spectral estimation; multiple broadband source location; simulation results; space-time statistic; statistical stability; steered covariance matrices; steered linear prediction; steered minimum variance; threshold observation time; Array signal processing; Bandwidth; Covariance matrix; Frequency estimation; Narrowband; Position measurement; Sensor arrays; Signal resolution; Spatial resolution; Statistics;
  • fLanguage
    English
  • Journal_Title
    Acoustics, Speech and Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-3518
  • Type

    jour

  • DOI
    10.1109/29.35386
  • Filename
    35386