DocumentCode
1234858
Title
Commentary: Material Review Board in 2003
Author
McLinn, James A.
Volume
52
Issue
2
fYear
2003
fDate
6/1/2003 12:00:00 AM
Firstpage
148
Lastpage
148
Keywords
Chapters; Engineering management; Failure analysis; Manufacturing; Pacemakers; Quality management; Reliability engineering; Semiconductor device reliability; Systems engineering and theory; Total quality management;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2003.811161
Filename
1211102
Link To Document