• DocumentCode
    1235472
  • Title

    Reconfiguration of VLSI arrays by covering

  • Author

    Lombardi, Fabrizio ; Sami, M.G. ; Stefanelli, R.

  • Author_Institution
    Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
  • Volume
    8
  • Issue
    9
  • fYear
    1989
  • fDate
    9/1/1989 12:00:00 AM
  • Firstpage
    952
  • Lastpage
    965
  • Abstract
    In VLSI arrays, redundant cells are added as spares. The proposed approach is applicable as an offline technique at either production time and/or run time. Reconfiguration is implemented by index mapping using a sequence of two operators. A reconfiguration algorithm which utilizes index mapping is proposed. This algorithm uses a new approach to the assignment problem. It is shown that reconfiguration of fault-free cells is equivalent to a covering of faulty cells by spare cells. It is also established that in a two-dimensional array the optimal spare assignment is given by a maximum matching. This translates to a maximum flow. It is shown that a variation of the matching preserves the optimality of the assignment, while reducing the time complexity of the reconfiguration algorithm Characterization theorems for index mapping and simulation results to substantiate the practicality of the approach are presented
  • Keywords
    VLSI; cellular arrays; circuit reliability; computational complexity; digital integrated circuits; integrated memory circuits; logic arrays; redundancy; VLSI arrays; assignment problem; characterisation theorems; fault tolerance; fault-free cells; index mapping; logic arrays; maximum flow; maximum matching; memory arrays; optimal spare assignment; reconfiguration algorithm; redundant cells; time complexity; two-dimensional array; Computational modeling; Computer architecture; Computer science; Fault tolerance; Production; Redundancy; Runtime; Silicon; Very large scale integration; Wafer scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.35547
  • Filename
    35547