• DocumentCode
    1236016
  • Title

    Fast Acting Fuses for the Protection of Semiconductors

  • Author

    Pearse, J.N. ; Newberry, P.G.

  • Author_Institution
    Senior Member, IEEE Appleton Electric Company, Chicago, Illinois
  • Issue
    4
  • fYear
    1970
  • fDate
    6/1/1970 12:00:00 AM
  • Firstpage
    332
  • Lastpage
    338
  • Abstract
    Co-ordination of semiconductors and high speed fuses with respect to surge ratings has been a relatively simple matter because of ample safety factors present in the published data. This has resulted in considerable difficulty in obtaining full semiconductor utilization, because the fuses so chosen tend to limit the maximum continuous semiconductor current. Since the semiconductor industry trend is towards higher continuous current ratings with the same published surge ratings, a closer evaluation of all aspects relating to fuse and semiconductor surge ratings is necessary to permit full use of the semiconductor´s maximum continuous current.
  • Keywords
    Assembly; Circuit faults; Circuit testing; Fuses; Safety; Semiconductor device manufacture; Semiconductor device testing; Surge protection; Thyristors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics and Control Instrumentation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9421
  • Type

    jour

  • DOI
    10.1109/TIECI.1970.229883
  • Filename
    1701809