• DocumentCode
    1238310
  • Title

    Physical properties of the superconducting Ta film absorber of an X-ray photon detector

  • Author

    Li, L. ; Frunzio, L. ; Wilson, C.M. ; Prober, D.E.

  • Author_Institution
    Depts. of Appl. Phys. & Phys., Yale Univ., New Haven, CT, USA
  • Volume
    13
  • Issue
    2
  • fYear
    2003
  • fDate
    6/1/2003 12:00:00 AM
  • Firstpage
    1124
  • Lastpage
    1127
  • Abstract
    We have developed single-photon 1-D imaging detectors based on superconducting tunnel junctions. The devices have a Ta film with an Al/AlOx/Al tunnel junction on each end and a Nb contact in the center. The best energy resolution of this kind of detector is 13 eV for 5.9 keV X-ray photons. Two devices with different lengths: 500 and 1000 μm are measured to study the nonequilibrium quasiparticle dynamics in the superconducting Ta film. The diffusion constant and lifetime of quasiparticles in the Ta films have been derived by fitting the measured current pulses to the model. The comparison of the simulation and measurement results proves that the quasiparticle loss is not primarily due to the Nb ground contact in the center of the Ta absorber, but is due to the uniform nonthermal loss in the Ta film. The Nb ground contact does contribute to the broadening of the energy width in the center of the Ta film.
  • Keywords
    X-ray detection; quasiparticles; superconducting junction devices; superconducting photodetectors; superconducting thin films; tantalum; type II superconductors; Al-AlOx-Al; Al/AlOx/Al tunnel junction; Nb; Nb contact; Ta; Ta superconducting film absorber; X-ray photon detector; energy resolution; nonequilibrium quasiparticle dynamics; quasiparticle diffusion constant; quasiparticle lifetime; single-photon 1D imaging detectors; superconducting tunnel junctions; Energy resolution; Josephson junctions; Length measurement; Niobium; Optical imaging; Pulse measurements; Superconducting films; X-ray detection; X-ray detectors; X-ray imaging;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2003.814171
  • Filename
    1211804