• DocumentCode
    123898
  • Title

    Critical Path Tracing Based Simulation of Transition Delay Faults

  • Author

    Kousaar, Jaak ; Ubar, Raimund ; Devadze, Sergei ; Raik, Jaan

  • Author_Institution
    Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
  • fYear
    2014
  • fDate
    27-29 Aug. 2014
  • Firstpage
    108
  • Lastpage
    113
  • Abstract
    A new method is presented for simulating of transition delay faults (TDF). The main idea of the method is to extend the TDF model, traditionally considered as a class of robustly tested delay faults, to a class of TDFs with extended detection conditions. Three known fault classes of delay fault sensitization are considered: robust, non-robust and functional sensitization of delay faults. Additionally, a new fault class is introduced, called non-robust functionally sensitized delay fault. A novel fault analysis algorithm based on 7-valued algebra is presented, which delivers the fault coverage for all mentioned four types of TDFs.
  • Keywords
    algebra; critical path analysis; delays; fault diagnosis; fault simulation; 7-valued algebra; TDF simulation; critical path tracing; delay fault testing; extended detection conditions; fault analysis algorithm; nonrobust functionally sensitized delay fault; transition delay fault; Algebra; Circuit faults; Delays; Integrated circuit modeling; Logic gates; Robustness; Solid modeling; 7-valued algebra; critical path fault tracing; non-robust and functional sensitization; transition delay faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design (DSD), 2014 17th Euromicro Conference on
  • Conference_Location
    Verona
  • Type

    conf

  • DOI
    10.1109/DSD.2014.17
  • Filename
    6927233