• DocumentCode
    1239327
  • Title

    Free carrier effect on the refractive index change in quantum-well structures

  • Author

    Tomita, Akihisa

  • Author_Institution
    Opto-Electron. Res. Labs., NEC Corp., Ibaraki, Japan
  • Volume
    30
  • Issue
    12
  • fYear
    1994
  • fDate
    12/1/1994 12:00:00 AM
  • Firstpage
    2798
  • Lastpage
    2802
  • Abstract
    Dielectric response of spatially inhomogeneous free carriers in quantum wells is studied by random phase approximation (RPA) for a high frequency (near infrared) light field. A general form for susceptibilities is derived for a guided optical mode. The analysis shows that a conventional treatment (Drude model) for the TE mode provides a good approximation. The susceptibility for the TM mode is almost the same as that for the TE mode, in spite of quantization of carrier motion, as long as the photon energy is much larger than the intersubband transition energy. The free carrier component of the refractive index change in quantum-well waveguides is thus isotropic near the band gap. Carrier confinement will not reduce the free carrier component in the linewidth enhancement factor around the lasing wavelength
  • Keywords
    RPA calculations; laser modes; optical susceptibility; quantum well lasers; refractive index; waveguide lasers; Drude model; TE mode; TM mode; carrier confinement; carrier motion; dielectric response; free carrier component; free carrier effect; guided optical mode; high frequency light field; intersubband transition energy; lasing wavelength; linewidth enhancement factor; near infrared light field; quantization; quantum-well structures; quantum-well waveguides; random phase approximation; refractive index change; spatially inhomogeneous free carriers; susceptibilities; Dielectrics; Frequency; Optical refraction; Optical variables control; Optical waveguides; Quantization; Quantum wells; Refractive index; Tellurium; Waveguide components;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.362730
  • Filename
    362730