Properties of bilayers based on Mo films for transition-edge sensors

Author

Rajteri, M. ; Monticone, E. ; Gandini, C. ; Portesi, C. ; Rocci, R. ; Bodoardo, S.

Author_Institution

Inst. Elettrotecnico Nazionale "Galileo Ferraris", Torino, Italy

Volume

13

Issue

2

fYear

2003

fDate

6/1/2003 12:00:00 AM

Firstpage

3292

Lastpage

3294

Abstract

Transition-edge sensors (TES) are promising devices for materials science and space applications due to their spectroscopic capabilities and good count rates. In this work, we report details on fabrication and characterization of Mo films and Mo/Ag bilayers that, being immiscible and nonreactive with each other, should have a long time stability. Both single superconducting films and bilayers of normal-superconducting materials have been deposited in UHV by e-gun. Structural and morphological properties have been investigated by x-ray diffraction and AFM. Bilayers with transition widths of 1 mK are achievable, adequate to realize high sensitivity thermometers.

Keywords

X-ray diffraction; atomic force microscopy; electron beam deposition; molybdenum; silver; superconducting photodetectors; superconducting thin films; AFM; Mo; Mo-Ag; X-ray diffraction; electron beam deposition; morphological properties; normal-superconducting bilayer; structural properties; superconducting film; thermometer; transition edge sensor; transition width; Gamma ray detectors; Infrared detectors; Sensor phenomena and characterization; Spectroscopy; Substrates; Superconducting films; Superconducting materials; Superconducting transition temperature; Temperature sensors; Thin film sensors;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2003.812291

Filename

1212329