• DocumentCode
    1242868
  • Title

    Frequency normalization of constant power contours for MESFETs

  • Author

    Mondal, J.P.

  • Author_Institution
    General Electric Co., Syracuse, NY, USA
  • Volume
    36
  • Issue
    6
  • fYear
    1988
  • fDate
    6/1/1988 12:00:00 AM
  • Firstpage
    1107
  • Lastpage
    1110
  • Abstract
    The constant power contours have been measured on MESFETs with different doping profiles over the frequency range 8-16 GHz for a fixed input power level at different bias points. At each frequency, the contours are normalized with respect to the load for maximum power output; within experimental accuracy, the normalization holds fairly well, independent of frequency under certain limits. The concept is an extension of small-signal mismatch circles. In case of large-signal applications, the mismatch contours are no longer circles, because of the way the saturation current and breakdown voltage limits are attained. The contours present some reflection coefficient loci with respect to a given load
  • Keywords
    S-parameters; Schottky gate field effect transistors; doping profiles; power transistors; solid-state microwave devices; 8 to 16 GHz; MESFETs; S-parameters measurement; SHF; constant power contours; doping profiles; large-signal applications; microwave power transistors; mismatch contours; reflection coefficient loci; Admittance; Electromagnetic scattering; Electromagnetic waveguides; Equations; Equivalent circuits; Frequency measurement; MESFETs; Phase measurement; Power measurement; Reflection;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.3642
  • Filename
    3642