Parametric yield prediction of complex, mixed-signal IC´s

A method is presented which helps the designer predict the parametric yield of complex mixed-signal IC´s in a reasonable time. It builds on previous approaches to IC yield prediction employing a Monte Carlo approach for flexibility, with behavioral simulation and response surfaces for speed. To analyze complex mixed-signal IC´s, a novel feature termed the correction layer is introduced. Complex mixed-signal IC´s have tests which are highly nonlinear. Consequently, it can be difficult to build accurate response surfaces whose response variables are the results of such tests. The correction layer is introduced to overcome this problem. It enables a response surface to be accurately used by the method. A commercial hard disk drive IC is analyzed as an example to show the necessity of having the correction layer in order to produce accurate parametric yield predictions