• DocumentCode
    1245120
  • Title

    An assessment of potential nonlinear circuit models for the characterization of resonant tunneling diodes

  • Author

    Woolard, Dwight L. ; Buot, Felix A. ; Rhodes, David L. ; Lu, Xiaojia ; Perlman, Barry S.

  • Author_Institution
    US Army Res. Lab., Fort Monmouth, NJ, USA
  • Volume
    43
  • Issue
    2
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    332
  • Lastpage
    341
  • Abstract
    The intrinsically fast process of resonant tunneling through double barrier heterostructures along with the existence of negative differential resistance in the current-voltage characteristic of these structures has led to their implementation as sources for high frequency electromagnetic energy. While sources based upon resonant tunneling diodes (RTDs) have produced frequency of oscillations up to 712 GHz, only microwatt levels of performance has been achieved above 100 GHz. Since stability criteria plays critical role in determining the deliverable power of any oscillator, a physically accurate equivalent-circuit model for the RTD is extremely important for optimizing the dynamics of the device-cavity package. This study identifies a distinctly new equivalent circuit model for characterizing the modes of oscillation in RTD-based sources. Specifically, in order to exhibit the fundamental self-oscillations and the overall I-V characteristics (plateau structure and hysteresis) observed experimentally, an accurate circuit model of the RTD must incorporate: (i) a quantum-well inductance which directly chokes the nonlinear conductance and, (ii) a nonlinear access resistance, associated with the accumulation of charge in the injection region of the double barriers, with a nonlocal dependence on the bias across the double barrier structure
  • Keywords
    electromagnetic oscillations; equivalent circuits; millimetre wave diodes; resonant tunnelling diodes; semiconductor device models; submillimetre wave diodes; 712 GHz; I-V characteristics; RTD characterization; RTD-based sources; charge accumulation; current-voltage characteristic; device-cavity package; double barrier heterostructures; equivalent-circuit model; fundamental self-oscillations; injection region; negative differential resistance; nonlinear access resistance; nonlinear circuit models; nonlinear conductance; oscillation modes; quantum-well inductance; resonant tunneling diodes; stability criteria; Current-voltage characteristics; Equivalent circuits; Frequency; Hysteresis; Light emitting diodes; Nonlinear circuits; Oscillators; Packaging; Resonant tunneling devices; Stability criteria;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.481736
  • Filename
    481736