• DocumentCode
    1245385
  • Title

    Robust system design with built-in soft-error resilience

  • Author

    Mitra, Subhasish ; Seifert, Norbert ; Zhang, Ming ; Shi, Quan ; Kim, Kee Sup

  • Volume
    38
  • Issue
    2
  • fYear
    2005
  • Firstpage
    43
  • Lastpage
    52
  • Abstract
    Transient errors caused by terrestrial radiation pose a major barrier to robust system design. A system´s susceptibility to such errors increases in advanced technologies, making the incorporation of effective protection mechanisms into chip designs essential. A new design paradigm reuses design-for-testability and debug resources to eliminate such errors.
  • Keywords
    SRAM chips; clocks; design for testability; fault tolerance; flip-flops; logic design; logic testing; system-on-chip; SRAM chips; built-in soft-error resilience; clocks; design-for-testability; flip-flops; logic design; logic testing; robust system design; terrestrial radiation; transient errors; Circuit testing; Computer errors; Flip-flops; Life estimation; Logic design; Network servers; Particle beams; Protection; Resilience; Robustness;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/MC.2005.70
  • Filename
    1401773
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1245385