Experimental results on buried microstrip lines for constructing high-density microwave integrated circuits

Author

Ishikawa, Takahide ; Yamashita, Eikichi

Author_Institution

Optoelectron. & Microwave Devices R&D Lab., Mitsubishi Electr. Corp., Hyogo, Japan

Volume

5

Issue

12

fYear

1995

fDate

12/1/1995 12:00:00 AM

Firstpage

437

Lastpage

438

Abstract

This letter describes the characterization and some experimental results of a buried microstrip line (BMSL), a guided-wave structure considered to be promising for constructing high-density microwave and millimeter-wave integrated circuits because of its high isolation characteristics. The BMSL structure is characterized practically by the rectangular boundary division (RED) method and rigorously by the finite difference time domain (FDTD) method. The analyzed results reveal that the BMSL structure possesses much lower coupling level than the conventional microstrip line does, from -15 to -100 dB depending on their burial depth. Experimental data show good agreement with numerical results

Keywords

finite difference time-domain analysis; microstrip circuits; microstrip lines; microwave integrated circuits; buried microstrip lines; coupling level; finite difference time domain method; guided-wave structure; high-density microwave integrated circuits; isolation; rectangular boundary division method; Conducting materials; Conductors; Coupling circuits; Dielectric constant; Dielectric materials; Dielectric substrates; Finite difference methods; Microstrip; Strips; Time domain analysis;

fLanguage

English

Journal_Title

Microwave and Guided Wave Letters, IEEE

Publisher

ieee

ISSN

1051-8207

Type

jour

DOI

10.1109/75.481853

Filename

481853