DocumentCode
1246573
Title
Lognormal and Weibull accelerated life test plans under distribution misspecification
Author
Pascual, Francis G. ; Montepiedra, Grace
Author_Institution
Dept. of Math., Washington State Univ., Pullman, WA, USA
Volume
54
Issue
1
fYear
2005
fDate
3/1/2005 12:00:00 AM
Firstpage
43
Lastpage
52
Abstract
In this article, we derive expressions for the asymptotic distribution of maximum likelihood estimators of model parameters in accelerated life tests (ALTs) when the model distribution is misspecified. We investigate results for two popular models, namely, the lognormal and Weibull Arrhenius-type ALT models. We propose test plan criteria based on asymptotic bias (ABias) and asymptotic mean squared error (AMSE) to derive ALT test plans. We derive 4:2:1 allocation plans that minimize either ABias2 or AMSE. These criteria provide control over estimation bias and variance when the model distribution is misspecified.
Keywords
Weibull distribution; failure analysis; life testing; log normal distribution; maximum likelihood estimation; mean square error methods; reliability theory; Weibull Arrhenius-type models; Weibull accelerated life test; asymptotic bias; asymptotic distribution; asymptotic mean squared error; distribution misspecification; lognormal test; maximum likelihood estimators; model parameters; optimal test plans; type I censoring; Life estimation; Life testing; Lifetime estimation; Maximum likelihood estimation; Mean square error methods; Minimax techniques; Parameter estimation; Stress; Voltage; Weibull distribution; Asymptotic bias; asymptotic mean square error; optimal test plans; relative efficiency; type I censoring;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2004.837316
Filename
1402679
Link To Document