• DocumentCode
    1246573
  • Title

    Lognormal and Weibull accelerated life test plans under distribution misspecification

  • Author

    Pascual, Francis G. ; Montepiedra, Grace

  • Author_Institution
    Dept. of Math., Washington State Univ., Pullman, WA, USA
  • Volume
    54
  • Issue
    1
  • fYear
    2005
  • fDate
    3/1/2005 12:00:00 AM
  • Firstpage
    43
  • Lastpage
    52
  • Abstract
    In this article, we derive expressions for the asymptotic distribution of maximum likelihood estimators of model parameters in accelerated life tests (ALTs) when the model distribution is misspecified. We investigate results for two popular models, namely, the lognormal and Weibull Arrhenius-type ALT models. We propose test plan criteria based on asymptotic bias (ABias) and asymptotic mean squared error (AMSE) to derive ALT test plans. We derive 4:2:1 allocation plans that minimize either ABias2 or AMSE. These criteria provide control over estimation bias and variance when the model distribution is misspecified.
  • Keywords
    Weibull distribution; failure analysis; life testing; log normal distribution; maximum likelihood estimation; mean square error methods; reliability theory; Weibull Arrhenius-type models; Weibull accelerated life test; asymptotic bias; asymptotic distribution; asymptotic mean squared error; distribution misspecification; lognormal test; maximum likelihood estimators; model parameters; optimal test plans; type I censoring; Life estimation; Life testing; Lifetime estimation; Maximum likelihood estimation; Mean square error methods; Minimax techniques; Parameter estimation; Stress; Voltage; Weibull distribution; Asymptotic bias; asymptotic mean square error; optimal test plans; relative efficiency; type I censoring;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2004.837316
  • Filename
    1402679