• DocumentCode
    1247320
  • Title

    Shielding effect of on-chip interconnect inductance

  • Author

    El-Moursy, Magdy A. ; Friedman, Eby G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Rochester, NY, USA
  • Volume
    13
  • Issue
    3
  • fYear
    2005
  • fDate
    3/1/2005 12:00:00 AM
  • Firstpage
    396
  • Lastpage
    400
  • Abstract
    Interconnect inductance introduces a shielding effect which decreases the effective capacitance seen by the driver of a circuit, reducing the gate delay. A model of the effective capacitance of an RLC load driven by a CMOS inverter is presented. The interconnect inductance decreases the gate delay and increases the time required for the signal to propagate across an interconnect, reducing the overall delay to drive an RLC load. Ignoring the line inductance overestimates the circuit delay, inefficiently oversizing the circuit driver. Considering line inductance in the design process saves gate area, reducing dynamic power dissipation. Average reductions in power of 17% and area of 29% are achieved for example circuits. An accurate model for a CMOS inverter and an RLC load is used to characterize the propagation delay. The accuracy of the delay model is within an average error of less than 9% as compared to SPICE.
  • Keywords
    CMOS logic circuits; RLC circuits; capacitance; driver circuits; inductance; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; shielding; CMOS inverter; RLC load; capacitance; circuit delay; circuit simulation; driver circuits; dynamic power dissipation; gate delay reduction; integrated circuit design; line inductance; on-chip interconnect inductance; propagation delay; shielding effect; Capacitance; Delay effects; Driver circuits; Inductance; Integrated circuit interconnections; Inverters; Process design; Propagation delay; RLC circuits; Semiconductor device modeling; CMOS; gate delay; interconnect modeling; on-chip inductance; propagation delay; shielding effect;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2004.842315
  • Filename
    1406045