• DocumentCode
    1248236
  • Title

    A 0.13- \\mu m CMOS 6 Gb/s/pin Memory Transceiver Using Pseudo-Differential Signaling for Removing Common-Mode Noise Due to SSN

  • Author

    Ha, Kyung-Soo ; Kim, Lee-Sup ; Bae, Seung-Jun ; Park, Kwang-Il ; Choi, Joo Sun ; Jun, Young-Hyun ; Kim, Kinam

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
  • Volume
    44
  • Issue
    11
  • fYear
    2009
  • Firstpage
    3146
  • Lastpage
    3162
  • Abstract
    A 6 Gb/s/pin transceiver for DRAM interfaces is implemented in a 0.13-mum CMOS process. Pseudo-differential signaling to overcome problems of conventional single-ended signaling is proposed. In a conventional single-ended signaling, the reference signal from a transmitter is generally used to reduce the common-mode noise which is induced by simultaneous switching noise (SSN). However, as supply voltage becomes low and data rate increases, the reference signal reduces the voltage and timing margin of receiver inputs. The proposed transceiver uses the pseudo-differential signaling without the reference signal and encoding schemes using the relation between neighboring data are proposed to remove the reference signal. In the receiver, transition-check circuit (TCC) is used to convert encoded data into original data before encoding. The proposed pseudo-differential signaling increases the eye-opening of 1:2 demuxed outputs of the receiver by 65 ps. The transceiver dissipates 242.5 mW and its active area is 1.0 mm times 0.3 mm.
  • Keywords
    CMOS integrated circuits; DRAM chips; transceivers; CMOS; DRAM interfaces; SSN; bit rate 6 Gbit/s; pin memory transceiver; pseudo-differential signaling; removing common mode noise; simultaneous switching noise; size 0.13 mum; transition-check circuit; Noise generators; Noise reduction; Pins; Random access memory; Signal generators; Signal processing; Timing; Transceivers; Transmitters; Voltage; DRAM interface; pseudo-differential signaling; simultaneous switching noise (SSN); single-ended signaling; transition-check circuit (TCC);
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2009.2031527
  • Filename
    5308593