• DocumentCode
    1250022
  • Title

    Low-cost modular totally self-checking checker design for m-out-of-n code

  • Author

    Chang, Wen-Feng ; Wu, Cheng-Wen

  • Author_Institution
    Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • Volume
    48
  • Issue
    8
  • fYear
    1999
  • fDate
    8/1/1999 12:00:00 AM
  • Firstpage
    815
  • Lastpage
    826
  • Abstract
    We present a low-cost (hardware-efficient) and fast totally self-checking (TSC) checker for m-out-of-n code, where m⩾3, 2m+1⩽n⩽4m. The checker is composed of four special adders which sum the 1s in the primary inputs added by appropriate constants, two ripple carry adders which sum the outputs of the biased-adders, and a t-variable two-rail code checker tree which compares the outputs of the two ripple carry adders, where k=[log2(n-m)+1]. All the modules are composed of 2-input gates and inverters. Compared with previous nonmodular methods, our TSC checker has a lower hardware and time complexity. Our method reduces the hardware complexity and circuit delay of the checker from O(n2) to O(n) and from O(n) to O(log2n), respectively. Compared with recent modular methods, our TSC checker has about the same hardware and time complexity, but is applicable to a much broader range of n. In summary, our method is superior to existing methods for the considered range of n. In addition, our TSC checker can easily be tested (the test set size of our TSC checker is relatively small) and implemented in VLSI for its modular structure
  • Keywords
    VLSI; adders; computational complexity; digital arithmetic; fault tolerant computing; logic testing; VLSI; adders; low-cost modular totally self-checking checker design; m-out-of-n code; modular structure; ripple carry adders; t-variable two-rail code checker tree; time complexity; Adders; Automatic testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Hardware; Information services; Logic testing; System testing;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.795123
  • Filename
    795123