• DocumentCode
    1252128
  • Title

    OpenDFM Bridging the Gap Between DRC and DFM

  • Author

    Buurma, J. ; Sayah, R. ; Valente, Filipe ; Rodgers, C.

  • Volume
    29
  • Issue
    6
  • fYear
    2012
  • Firstpage
    84
  • Lastpage
    90
  • Abstract
    This paper presents the details of a standard, named OpenDFM, which describes an efficient method to ensure manufacturability of integrated circuits that are designed at advanced technology nodes of today and one that can scale to address similar issues at future nodes as well. OpenDFM uses a meta-language format to capture and improve critical patterns that must be tested to ensure correct manufacturing and thus enhance yield.
  • Keywords
    design for manufacture; integrated circuit manufacture; DRC; OpenDFM standard; design for manufacturability; integrated circuit manufacture; meta-language format; Economics; Manufacturing; Schedules; Semiconductor device manufacture; Semiconductor device packaging; System-on-a-chip; EDA Standards; OpenDFM; Semiconductor Manufacturability,;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2012.2210380
  • Filename
    6249795
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1252128