Techniques of improved signal extraction in scan conversion-based transient digitizers

Author

Arpaia, Pasquale ; Baccigalupi, Aldo ; Cennamo, Felice

Author_Institution

Dipt. di Ingegneria Elettrica, Naples Univ., Italy

Volume

46

Issue

4

fYear

1997

fDate

8/1/1997 12:00:00 AM

Firstpage

893

Lastpage

898

Abstract

This paper deals with a technique to improve the signal extraction from the target diode matrix of scan conversion-based transient digitizers. The target charge distribution corresponding to the input signal is analyzed through statistical-based techniques. The identification of the distribution model allows main distortion effects to be identified and corrected. Experimental results of tests carried out on an actual scan converter using dc and sine wave signals showed that signal extraction can be improved mostly by correcting the center displacement of the column distributions

Keywords

charge measurement; electric distortion; electric distortion measurement; quantisation (signal); statistical analysis; transient analysis; A/D converters; center displacement correction; column distributions; dc signals; distortion effects; distribution model; identification; scan conversion-based transient digitizers; signal extraction; sine wave signals; statistical techniques; target charge distribution; target diode matrix; Dispersion; Distortion measurement; Electron beams; Matrix converters; Semiconductor diodes; Signal analysis; Statistical analysis; Testing; Vision defects; Writing;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.650795

Filename

650795