• DocumentCode
    1254791
  • Title

    Error-free optical inter-node connection for the massively parallel computer

  • Author

    Nishimura, Shinji ; Inoue, Hiroaki ; Hanatani, Shoichi ; Matsuoka, Hiroshi ; Yokota, Takashi

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • Volume
    10
  • Issue
    1
  • fYear
    1998
  • Firstpage
    147
  • Lastpage
    149
  • Abstract
    An optical inter-node connection in a massively parallel computer testbed was used in order to determine whether large throughput highly reliable inter-node communication is attainable. Highly reliable 48-b parallel-data transmission at 100 MHz (600-MB/s throughput) was achieved. For error-free data transmission, the total skew in the inter-node data transmission was suppressed to less than /spl plusmn/1 ns. In an 80-h pseudorandom packet-data transmission test, no errors were detected. This corresponds to a BER of less than 2.17/spl times/10/sup -15/. Thus, it is clearly shown that the optical interconnection overcomes the communication bottleneck in parallel-processing systems.
  • Keywords
    computer networks; data communication; fault tolerant computing; modules; multiprocessor interconnection networks; optical computing; optical fibre communication; optical interconnections; parallel architectures; reliability; 48 B/s; 80 h; communication bottleneck; error-free optical inter-node connection; highly reliable inter-node communication; highly reliable parallel-data transmission; inter-node data transmission; large throughput; massively parallel computer; massively parallel computer testbed; optical inter-node connection; optical interconnection; parallel-processing systems; pseudorandom packet-data transmission test; total skew; Circuit testing; Computer errors; Concurrent computing; Data communication; High speed optical techniques; Optical arrays; Optical computing; Optical interconnections; Optical sensors; Throughput;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.651142
  • Filename
    651142