• DocumentCode
    1255048
  • Title

    Thermal resistance evaluation of high-speed VCSELs: an isothermal optical transient technique

  • Author

    Kyriakis-Bizaros, E.D. ; Halkias, G.

  • Author_Institution
    Inst. of Microelectron., Athens, Greece
  • Volume
    14
  • Issue
    3
  • fYear
    2002
  • fDate
    3/1/2002 12:00:00 AM
  • Firstpage
    269
  • Lastpage
    271
  • Abstract
    A new method for the estimation of the overall thermal resistance of high-speed vertical-cavity surface-emitting lasers (VCSELs) is presented. The method is based on an isothermal optical transient (IOT) approach heavily relying on the following two basic features: 1) the high-speed VCSELs have an optical-electrical transient response much faster than their thermal response, and 2) each operating point, defined by the driving current, the emitted optical power, and the internal temperature of the VCSEL is unique. As a proof of concept, the IOT procedure has been simulated using accurate VCSEL models. These simulations have clearly demonstrated the potential of the IOT method to achieve accurate estimates of the overall thermal resistance of VCSELs.
  • Keywords
    semiconductor device models; surface emitting lasers; thermal resistance measurement; transient response; accurate VCSEL models; circuit level model; driving current step; high-speed VCSEL; isothermal optical transient technique; one-dimensional thermal-rate equation; optical-electrical transient response; overall thermal resistance; Electrical resistance measurement; High speed optical techniques; Isothermal processes; Optical surface waves; Stimulated emission; Surface emitting lasers; Surface resistance; Temperature; Thermal resistance; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.986782
  • Filename
    986782