• DocumentCode
    1255199
  • Title

    Comment on "Using the /spl lambda/ function to evaluate probe measurements of charged dielectric surfaces" [with reply]

  • Author

    Rerup, T.O. ; Crichlon, G.C. ; McAllister, I.W.

  • Volume
    4
  • Issue
    4
  • fYear
    1997
  • Firstpage
    470
  • Lastpage
    473
  • Abstract
    For original paper, see T.O. Rerup et al., ibid., vol. 3, pp. 770-777 (1996). Rerup et al. described the calibration of electrostatic probes used to measure the surface charge on dielectrics. This work showed that the use of the probe response theorem (the /spl lambda/ function), rather than the simple capacitative formula, leads to better experimental values. In this discussion, the commenter wishes to show that a more detailed interpretation can be extracted from the numerical results. In reply, Rerup et al. demonstrate that simple statistics cannot be used to extract, in a conclusive manner, a more detailed interpretation of the /spl sigma//sub /spl lambda//,/spl sigma//sub D/ patterns. Moreover, with the limitations imposed by the axially symmetric /spl lambda/ function, there is little to be gained in pursuing the source of the discrepancies between /spl sigma//sub /spl lambda// and /spl sigma//sub F/. They agree with the commenter that a multi-point scanning procedure would be essential if the functional form of the surface charge distribution were unknown.
  • Keywords
    charge measurement; dielectric materials; insulation testing; probes; statistical analysis; surface charging; /spl lambda/ function; Faraday cage measurements; charged dielectric surfaces; electrostatic probes; multi-point scanning procedure; numerical results; probe measurements; probe response theorem; statistics; surface charge measurement; Calibration; Capacitance measurement; Charge measurement; Current measurement; Density measurement; Dielectric measurements; Electrostatic measurements; Probes; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.625365
  • Filename
    625365