• DocumentCode
    125734
  • Title

    Perturbation analysis of the TE plane wave scattering from the end-face of a waveguide system

  • Author

    Komiyama, Akira

  • Author_Institution
    Osaka Electro-Commun. Univ., Neyagawa, Japan
  • fYear
    2014
  • fDate
    16-23 Aug. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The scattering of TE plane wave from the end-face of a two-dimensional waveguide system is treated by solving straightforwardly a wave equation for the electric field. The unknown scattered field is expanded into a perturbation series with respect to the difference of refractive indices of core and cladding. The first and second order terms of the series are analytically derived and it is shown that the second order term is sufficiently small compared with the first order term and can be ignored.
  • Keywords
    electric fields; electromagnetic wave scattering; perturbation techniques; refractive index; waveguides; TE plane wave scattering; electric field; end face; perturbation analysis; refractive indices; two dimensional waveguide system; unknown scattered field; wave equation; Dielectrics; Integral equations; Laser beams; Optical waveguides; Planar waveguides; Scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    General Assembly and Scientific Symposium (URSI GASS), 2014 XXXIth URSI
  • Conference_Location
    Beijing
  • Type

    conf

  • DOI
    10.1109/URSIGASS.2014.6929099
  • Filename
    6929099